Bruker DektakXT

Surface Profilometer 

Profilometer

The Bruker benchtop DektakXT surface profile measuring system is an automated profilometer with 3D mapping functionality. It features motorized X/Y stage as well as a motorized R-Theta. This system utilizes a direct drive scan stage that accelerates measurements scans times by 40%. This system enables nanometer-level surface measurements for microelectronics, semiconductors, solar, high-brightness LED, medical and materials science applications

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More Information 

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