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Bruker DektakXT
Surface Profilometer
The Bruker benchtop DektakXT surface profile measuring system is an automated profilometer with 3D mapping functionality. It features motorized X/Y stage as well as a motorized R-Theta. This system utilizes a direct drive scan stage that accelerates measurements scans times by 40%. This system enables nanometer-level surface measurements for microelectronics, semiconductors, solar, high-brightness LED, medical and materials science applications |
Equipment Training Request Reservations User Manual |
More InformationSurface Texture Analysis Using Dektak Stylus Profilers Dektak Stylus Capabilities - How to Choose the Correct Stylus for Any Applications |