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Field Emission Scanning Electron Microscope (FE-SEM)
FE-SEM
The JEOL JSM-7610F FEG-SEM combines two proven technologies – an electron column with semi-in-lens detectors and an in-the-lens Schottky field emission gun – to deliver ultrahigh resolution with wide range of probe currents for all applications (1pA to more than 200 nA). The JSM-7600F offers true 1,000,000X magnification with 1nm resolution and unmatched stability, making it possible to observe the fine surface morphology of nanostructures.
The JSM-7610F successfully integrates a full set of detectors for secondary electrons, backscattered electrons, EDS, WDS, EBSD, CL, and more. The large specimen chamber accommodates a 200 mm diameter sample.
Applications:
- Nanotechnology
- Material science
- Biology
- Cryo-microscopy
- Lithography
- Compositional and structural analysis
Reservations for Using Tool
All users are required to complete mandatory training on this tool before permission and access to this tool will be granted. For more information please send your request to cmnbtr@gmail.com.
Please complete the reservation form to reserve this tool.